American Elements Logo and U.S. Registered Trademark
Hafnium Ribbon
High Purity Hf Wire
7440-58-6
Product
Product Code
Order or Specifications
99% Hafnium Ribbon
HF-M-02-RI
Contact American Elements
99.5% Hafnium Ribbon
HF-M-025-RI
Contact American Elements
99.9% Hafnium Ribbon
HF-M-03-RI
Contact American Elements
99.95% Hafnium Ribbon
HF-M-035-RI
Contact American Elements
99.99% Hafnium Ribbon
HF-M-04-RI
Contact American Elements
99.999% Hafnium Ribbon
HF-M-05-RI
Contact American Elements

See research below. American Elements specializes in producing Aluminum as ribbon in various thicknesses and sizes. Most ribbon is rolled High Purity Metallic Ribbonfor use in coating and thin film Chemical Vapor Deposition (CVD) and Physical Vapor Deposition (PVD) processes including Thermal and Electron Beam (E-Beam) Evaporation, Low Temperature Organic Evaporation, Atomic Layer Deposition (ALD), Organometallic and Chemical Vapor Deposition (MOCVD) for specific applications such as fuel cells and solar energy . Thicknesses up to 0.02" and widths up to 1" are available for most metals. Materials are produced using crystallization , solid state and other ultra high purification processes such as sublimation. American Elements specializes in producing custom compositions for commercial and research applications and for new proprietary technologies. American Elements also casts any of the rare earth metals and most other advanced materials into rod, bar or plate form , as well as other machined shapes and through other processes such as nanoparticles (See also application discussion at Nanotechnology Information and at Quantum Dots ) and in the form of solutions and organometallics . We also produce Hafnium as rods, powder and plates. Other shapes are available by request.

Hafnium is a Block D, Group 4, Period 6 element. The electronic configuration is [Xe] 4f14 5d2 6s2. In its elemental form hafnium's CAS number is 7440-58-6. The hafnium atom has a radius of 156.4.pm and it's Van der Waals radius is 200.pm. Hafnium is one of the Group IV transition elements that is refined from various zirconic mineral deposits. Hafnium is available as metal and compounds with purities from 99% to 99.999% (ACS grade to ultra-high purity); metals in the form of foil, sputtering target, and rod, and compounds as submicron and nanopowder. It's primary uses are due to its ability as a nuclear "getter" or absorber of neutrons. It is a primary component in nuclear control rods for this purpose. It also finds uses as a dopant in the alloy of steel and titanium. It is also used in the production of mantles for high intensity incandescent lamps. Hafnium is replacing polysilicon as the principle gate or electrode material in metal oxide semiconductor field effect transistors (MOSFETs) which are the basis for all modern semiconductors. As semiconductors have gotten smaller, the limiting factor in further size reduction has been the ability of the silicon oxide gate to perform below 10 angstroms where leakage occurs. Recent research has been devoted to the development of High-k materials which can function as a di-electric barrier or gate with lower leakage. Using hafnium based alloys as this di-electric gate has allowed for the development of MOSFET gates smaller than 10 angstroms. This allows for further size reduction, reduced switching power requirements and improved performance.

Formula CAS No. Appearance Molecular Weight
Hf 7440-58-6 silver 178.49
PRODUCT CATALOG Submicron & Nanopowder Tolling Ultra High Purity Sputtering Target Crystal Growth Rod, Plate, Powder, etc.
German   Korean   French   Japanese   Spanish   Chinese (Simplified)   Portuguese   Russian   Chinese (Taiwan)   Italian   Turkish   Polish   Dutch   Czech   Swedish   Hungarian   Danish   Hebrew

Production Catalog Available in 32 Countries
 
Periodic table of the elements science and academic information, elements and advanced materials data, scientific presentations and all pages, designs, concepts, logos, and color schemes herein are the copyrighted proprietary rights and intellectual property of American Elements. American Elements is a U.S. Registered Trademark. © 2001-2009. American Elements. All rights reserved.

 

Recent Research & Development for Hafnium

  • Catalytic transamidation reactions compatible with tertiary amide metathesis under ambient conditions. Stephenson NA, Zhu J, Gellman SH, Stahl SS. J Am Chem Soc. 2009 Jul 29;131(29):10003-8. PMID: 19621957 [PubMed - in process]

  • Synthesis and structure of dinuclear hafnium(IV) and zirconium(IV) complexes sandwiched between 2 mono-lacunary alpha-Keggin polyoxometalates. Nomiya K, Saku Y, Yamada S, Takahashi W, Sekiya H, Shinohara A, Ishimaru M, Sakai Y. Dalton Trans. 2009 Jul 28;(28):5504-11. Epub 2009 May 29. PMID: 19587994 [PubMed - in process]

    Comparison of the synthesis of Ge nanocrystals in hafnium aluminum oxide and silicon oxide matrices. Chew HG, Zheng F, Choi WK, Chim WK, Fitzgerald EA, Foo YL. J Nanosci Nanotechnol. 2009 Feb;9(2):1577-81. PMID: 19441574 [PubMed]

    The controlled deposition of metal oxides onto carbon nanotubes by atomic layer deposition: examples and a case study on the application of V2O4 coated nanotubes in gas sensing. Willinger MG, Neri G, Bonavita A, Micali G, Rauwel E, Herntrich T, Pinna N. Phys Chem Chem Phys. 2009 May 21;11(19):3615-22. Epub 2009 Mar 30. PMID: 19421470 [PubMed]

    Atomic scale imaging and spectroscopy of individual electron trap states using force detected dynamic tunnelling. Johnson JP, Zheng N, Williams CC. Nanotechnology. 2009 Feb 4;20(5):55701. Epub 2009 Jan 12. PMID: 19417360 [PubMed - indexed for MEDLINE]

    Observation of Zr2(2+), Cd2(2+), Hf2(2+), W2(2+), and Pt2(2+) in the gas phase. Franzreb K, Pis Diez R, Alonso JA. J Chem Phys. 2009 Apr 14;130(14):144312. PMID: 19368450 [PubMed]

    Hafnium carbamates and ureates: new class of precursors for low-temperature growth of HfO2 thin films. Pothiraja R, Milanov AP, Barreca D, Gasparotto A, Becker HW, Winter M, Fischer RA, Devi A. Chem Commun (Camb). 2009 Apr 21;(15):1978-80. Epub 2009 Feb 25. PMID: 19333463 [PubMed]

    Internal correction of hafnium oxide spectral interferences and mass bias in the determination of platinum in environmental samples using isotope dilution analysis. Rodríguez-Castrillón JA, Moldovan M, García Alonso JI. Anal Bioanal Chem. 2009 May;394(1):351-62. Epub 2009 Mar 14. PMID: 19288088 [PubMed]

    Determination of microamounts of hafnium in zirconium using inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry during their separation by ion exchange on Diphonix chelating resin. Smolik M, Jakóbik-Kolon A. Anal Chem. 2009 Apr 1;81(7):2685-7. PMID: 19256520 [PubMed]

    Reactive landing of gas-phase ions as a tool for the fabrication of metal oxide surfaces for in situ phosphopeptide enrichment. Blacken GR, Volný M, Diener M, Jackson KE, Ranjitkar P, Maly DJ, Turecek F. J Am Soc Mass Spectrom. 2009 Jun;20(6):915-26. Epub 2009 Jan 22. PMID: 19251440 [PubMed - in process]

    Isolation of a 177Hf complex formed by beta-decay of a 177Lu-labeled radiotherapeutic compound and NMR structural elucidation of the ligand and its Lu and Hf complexes. Cagnolini A, D'Amelio N, Metcalfe E, Nguyen HD, Aime S, Swenson RE, Linder KE. Inorg Chem. 2009 Apr 6;48(7):3114-24. PMID: 19243162 [PubMed - indexed for MEDLINE]

    Synthetic Studies on (-)-Lemonomycin: An Efficient Asymmetric Synthesis of Lemonomycinone Amide. Wu YC, Bernadat G, Masson G, Couturier C, Schlama T, Zhu J. J Org Chem. 2009 Feb 5. [Epub ahead of print] PMID: 19196163 [PubMed - as supplied by publisher]

    Fourier transform infrared spectroscopy and solid-state nuclear magnetic resonance studies of octadecyl modified metal oxides obtained from different silane precursors. Kailasam K, Natile MM, Glisenti A, Müller K. J Chromatogr A. 2009 Mar 20;1216(12):2345-54. Epub 2009 Jan 9. PMID: 19178911 [PubMed - indexed for MEDLINE]

    Hafnium transistor design for neural interfacing. Parent DW, Basham EJ. Conf Proc IEEE Eng Med Biol Soc. 2008;2008:3356-9. PMID: 19163428 [PubMed - indexed for MEDLINE]

    Sandwich-type Hf(IV) and Zr(IV)complexes composed of tri-lacunary Keggin polyoxometalates: structure of [M(3)(mu-OH)(3)(A-alpha-PW(9)O(34))(2)](9-) (M = Hf and Zr). Saku Y, Sakai Y, Shinohara A, Hayashi K, Yoshida S, Kato CN, Yoza K, Nomiya K. Dalton Trans. 2009 Feb 7;(5):805-13. Epub 2008 Dec 4. PMID: 19156274 [PubMed - indexed for MEDLINE]

    High-speed memory from carbon nanotube field-effect transistors with high-kappa gate dielectric. Rinkiö M, Johansson A, Paraoanu GS, Törmä P. Nano Lett. 2009 Feb;9(2):643-7. PMID: 19152310 [PubMed]

    Study on the formation of self-assembled monolayers on sol-gel processed hafnium oxide as dielectric layers. Ting GG 2nd, Acton O, Ma H, Ka JW, Jen AK. Langmuir. 2009 Feb 17;25(4):2140-7. PMID: 19128035 [PubMed]

    Enrichment/isolation of phosphorylated peptides on hafnium oxide prior to mass spectrometric analysis. Rivera JG, Choi YS, Vujcic S, Wood TD, Colón LA. Analyst. 2009 Jan;134(1):31-3. Epub 2008 Oct 21. PMID: 19082170 [PubMed - in process]

    A combined ab initio and Franck-Condon factor simulation study on the photodetachment spectrum of HfO2-. Mok DK, Lee EP, Chau FT, Dyke JM. Phys Chem Chem Phys. 2008 Dec 28;10(48):7270-7. Epub 2008 Oct 29. PMID: 19060972 [PubMed - indexed for MEDLINE]

    Generation of oxide nanopatterns by combining self-assembly of S-layer proteins and area-selective atomic layer deposition. Liu J, Mao Y, Lan E, Banatao DR, Forse GJ, Lu J, Blom HO, Yeates TO, Dunn B, Chang JP. J Am Chem Soc. 2008 Dec 17;130(50):16908-13. PMID: 19053479 [PubMed - indexed for MEDLINE] Related Articles

 

 

 

 

American Elements Products can also be sourced at these sites:
 
 
 
electronics-ee.com