American Elements Logo and U.S. Registered Trademark
Silicon Arsenide
Product
Product Code
Order or Specifications
99.999% Silicon Arsenide Powder
SI-AS-05-P
Contact American Elements
99.999% Silicon Arsenide Ingot
SI-AS-05-I
Contact American Elements
99.999% Silicon Arsenide Chunk
SI-AS-05-CK
Contact American Elements
99.999% Silicon Arsenide Lump
SI-AS-05-L
Contact American Elements
99.999% Silicon Arsenide Sputtering Target
SI-AS-05-ST
Contact American Elements
Silicon-Arsenide is a semiconductor and is used in the production of semiconductors as a substitute for direct arsenic usage. Additional technical, research and safety (MSDS) information is available.

Silicon is a Block P, Group 14, Period 3 element. The electronic configuration is [Ne] 3s2 3p2. In its elemental form silicon's CAS number is 7440-21-3. The silicon atom has a radius of 117.6.pm and it's Van der Waals radius is 210.pm. Silicon is one of man's most useful elements. It makes up 25.7% of the earth's crust, by weight, and is the second most abundant element, being exceeded only by oxygen. The Czochralski process is commonly used to produce single crystals of silicon used for solid-state or semiconductor devices. Silica, as sand, is a principal ingredient of glass, one of the most inexpensive of materials with excellent mechanical, optical, thermal, and electrical properties.

Arsenic is a Block P, Group 15, Period 4 element. The electronic configuration is [Ar] 3d10 4s2 4p3. In its elemental form arsenic's CAS number is 1327-53-3. The arsenic atom has a radius of 124.5.pm and it's Van der Waals radius is 185.pm. Arsenic has numerous applications as a semiconductor and other electronic applications as Indium arsenide, silicon arsenide and tin arsenidea. Arsenic is finding increasing uses as a doping agent in solid-state devices such as transistors. Gallium arsenide is used as a laser material to convert electricity directly into coherent light. Arsenic is used in bronzing and for hardening and improving the sphericity of shot. Arsenic is available as metal and compounds with purities from 99% to 99.9999% (ACS grade to ultra-high purity); metals in the form of foil, sputtering target, and rod, and compounds as submicron and nanopowder.

American Elements semi conducting materials are crystal structures produced from ultra high purity starting materials synthesized by our high purity production facility which includes several large electric muffle furnaces, a tube furnace for hydrogen reduction, 50 gallon glass-lined Pfaudler reactors supported by our analytical laboratory containing X-ray diffraction, SEM, AA, BET surface area, and ICP Spectrometry for trace metals analysis. See a discussion of American Elements Ultra High Purity and Analytical capabilities. See Crystal Growth for processes used to fabricate semiconductor materials, which include:

  • Crystal "pulling" by the Czochaiski method for production of semiconductor materials
  • Flux growth and gradient freeze
  • Directional solidification of fluorites using both the Bridgman-Stockbarger and float zoning techniques
PRODUCT CATALOG Submicron & Nanopowder Tolling Ultra High Purity Sputtering Target Crystal Growth Rod, Plate, Powder, etc.
© 2001-2008. American Elements is a U.S. Registered Trademark. All rights reserved.
This website and all pages, designs, concepts, logos, and color schemes herein are
the copyrighted proprietary rights and intellectual property of American Elements.

 

Recent Research & Development for Silicon

  • Analysis of amorphous-nano-crystalline multilayer structures by optical, photo-deflection and photo-current spectroscopy. Micron. 2008 Apr 4. [Epub ahead of print]

  • Bronchial obstruction due to teflon pledgets migration 13 years after lobectomy. Ann Thorac Surg. 2008 Jun;85(6):2116-8.

  • Ultra-sensitive detection of bacterial toxin with silicon nanowire transistor. Lab Chip. 2008 Jun;8(6):868-71. Epub 2008 Apr 29.

  • Quality assurance for the geometric accuracy of cone-beam CT guidance in radiation therapy. Int J Radiat Oncol Biol Phys. 2008;71(1 Suppl):S57-61.

  • Silicon-Based Building Blocks for One-Step (18)F-Radiolabeling of Peptides for PET Imaging. Angew Chem Int Ed Engl. 2008 May 21. [Epub ahead of print] No abstract available.

  • Enhanced Rat Sciatic Nerve Regeneration through Silicon Tubes Implanted with Valproic Acid. J Reconstr Microsurg. 2008 May 21. [Epub ahead of print]

  • Automated wavelet denoising of photoacoustic signals for circulating melanoma cell detection and burn image reconstruction. Phys Med Biol. 2008 May 21;53(12):N227. [Epub ahead of print]

  • High-density cochlear implants with position sensing and control. Hear Res. 2008 Apr 14. [Epub ahead of print]

  • Micromixers to produce cosmetic emulsions. Int J Cosmet Sci. 2003 Apr;25(1-2):1-4.

  • Molecular Transfer of Surfactant Bilayers: Widening the Range of Substrates. Langmuir. 2008 May 22. [Epub ahead of print]

  • Design of a polarized head-mounted projection display using ferroelectric liquid-crystal-on-silicon microdisplays. Appl Opt. 2008 May 20;47(15):2888-96.

  • Photoluminescence emission profiles of Y(2)O(3):Eu films composed of high-low density stacks produced by glancing angle deposition. Appl Opt. 2008 May 20;47(15):2798-805.

  • Combined fluorescent and interferometric detection of protein on a BioCD. Appl Opt. 2008 May 20;47(15):2779-89.

  • The impact of MLC transmitted radiation on EPID dosimetry for dynamic MLC beams. Med Phys. 2008 Apr;35(4):1267-77.

  • Testing of silicon nitride ceramic bearings for total hip arthroplasty. J Biomed Mater Res B Appl Biomater. 2008 May 19. [Epub ahead of print]

  • Desorption Ionization of Biomolecules on Metals. Anal Chem. 2008 May 20. [Epub ahead of print]

  • Acoustophoresis in Wet-Etched Glass Chips. Anal Chem. 2008 May 20. [Epub ahead of print]

  • Long-term development of inorganic nutrients and chlorophyll alpha in the open northern Baltic Sea. Ambio. 2008 Mar;37(2):86-92.

  • Quantitative measurements of C-reactive protein using silicon nanowire arrays. Int J Nanomedicine. 2008;3(1):117-24.

  • A PIXEL DETECTOR-BASED SINGLE PHOTON-COUNTING SYSTEM AS FAST SPECTROMETER FOR DIAGNOSTIC X-RAY BEAMS. Radiat Prot Dosimetry. 2008 May 16. [Epub ahead of print]

 

 

 

 

American Elements Products can also be sourced at these sites:
 
 
 
electronics-ee.com