Author(s) Song, D.H.; Kim, K.T.; Ji, C.H.; Oh, S.Y.
Journal J Nanosci Nanotechnol
Date Published 2019 Aug 01

Organic photodetector (OPD) performance is affected significantly by leakage current. In this study, to decrease OPD leakage current, we introduced hafnium oxide as an electron blocking material, using a solution fabrication process. We fabricated an OPD consisting of ITO/HfO₂/PCHT:PCBM/Yb/Al, and measured its characteristics, external quantum efficiency, and transient photocurrents. We found that the thickness of the hafnium oxide layer affected the detectivity of the prepared OPD. In particular, a device having an ultrathin hafnium oxide film (5.5 nm thick) exhibited a high on-off current ratio of up to 2.26 × 10 at -1 V, which is two times higher than that of a device having a PEDOT:PSS electron blocking layer.

DOI 10.1166/jnn.2019.16701
ISSN 1533-4880
Citation J Nanosci Nanotechnol. 2019;19(8):47244726.

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