Atomic scale characterization of point and extended defects in niobate thin films.

Author(s) Li, C.; Song, D.; Li, M.; Tang, C.; Xue, D.; Wan, D.; Pennycook, S.J.
Journal Ultramicroscopy
Date Published 2019 Aug
Abstract

Niobium-based oxides have a wide range of applications owing to their rich crystal and electronic structures. Defects at the atomic scale are always unavoidable and will affect their functionalities, especially when in the form of thin films. Here, atomic resolution scanning transmission electron microscopy and electron energy loss spectroscopy have been performed on various defects (point, line, planar defects and segregated phases) in alkaline and alkaline-earth niobate thin films: CaZrO modified (K, Na)NbO and strontium niobate (SNO), respectively. In CaZrO modified (K,Na)NbO thin films, a tetragonal tungsten bronze phase was found, with a sharp boundary with the perovskite phase. In SNO thin films, several kinds of point defects and antiphase boundaries are commonly observed. In addition, a strongly Sr deficient phase, SrNbO, precipitates inside the SrNbO phase with a coherent interface. The different oxidation states of Nb in SrNbO and SrNbO were revealed from the O K edge. Our characterization of the point defects and extended defects in niobate thin films offers practical guidelines for thin film deposition or discovery of defect-based novel functionalities.

DOI 10.1016/j.ultramic.2019.03.003
ISSN 1879-2723
Citation Li C, Song D, Li M, Tang C, Xue D, Wan D, et al. Atomic scale characterization of point and extended defects in niobate thin films. Ultramicroscopy. 2019;203:82-87.

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